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Design of Built-In Self Test for Self-Repairing Digital System

R.Devika, S.Mahaboob Basha

Self-repairing system is alternative for fault tolerant systems. They lose efficiency when the circuit size increases, due to the extra hardware. In existing system, they used four spare cells for one working cell for cell replacement.In proposed system, there is no need to use spare cells permanently.In proposed system, we have taken RISC processor as a working cell for our consideration. BIST architecture is used to detect the occurrence of fault in working cell. If there are any chances for the fault occurrence, it will trigger the working cell to overcome the fault. So there is no need to keep spare cell permanently, as in existing system. We are considered multiprocessor application for self-repairing system and compare area, power and delay of the proposed and existing system